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Göteborgs universitets publikationer

Quantification problems in depth profiling of PWR steels using Ar+ ion sputtering and XPS analysis

Författare och institution:
V.A. Ignatova (-); S. Van Den Berghe (-); St. Van Dyck (-); Vladimir Popok (Institutionen för fysik (GU))
Publicerad i:
Microscopy and Microanalysis, 12 ( 5 ) s. 432-437
Artikel, refereegranskad vetenskaplig
Sammanfattning (abstract):
The oxide scales of AISI 304 formed in boric acid solutions at 300°C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20–30 nm), being an order of magnitude lower than the crater depth (0.2–0.5 [mu]m), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed—one hydroxide (mainly iron–nickel based) on top and a second one deeper, mainly consisting of iron–chromium oxides.
Ämne (baseras på Högskoleverkets indelning av forskningsämnen):
Fysik ->
Subatomär fysik ->
Fysik ->
Den kondenserade materiens fysik
PWR steels; XPS depth profiling; XPS quantification; erosion rate calibration
Postens nummer:
Posten skapad:
2007-12-13 14:53

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