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Comparing depth profiling of oxide scale on SOFC interconnect-materials using ToF-SIMS with Ga-69(+), Bi-3(+)/Cs+ and C-60(+)/C-60(2+) as primary and sputter ions

Författare och institution:
Josefin Hall (Institutionen för kemi och kemiteknik, Oorganisk miljökemi, Chalmers); U. Bexell (-); John S. Fletcher (Institutionen för kemi och molekylärbiologi); Sead Canovic (Institutionen för kemi och kemiteknik, Oorganisk miljökemi, Chalmers); Per Malmberg (Institutionen för kemi och kemiteknik, Oorganisk miljökemi, Chalmers & Institutionen för kemi och molekylärbiologi)
Publicerad i:
Materials at High Temperatures, 32 ( 1-2 ) s. 133-141
ISSN:
0960-3409
Publikationstyp:
Artikel, refereegranskad vetenskaplig
Publiceringsår:
2015
Språk:
engelska
Fulltextlänk:
Sammanfattning (abstract):
Oxide scale cross-sections of CeO2 coated FeCr based solid oxide fuel cell interconnect materials were examined using secondary ion mass spectrometry (SIMS) depth profiling. A duplex spinel : chromia scale was formed after 1 h at 850 degrees C. Ti and ceria were observed between these layers. Additionally, minor concentrations of Mn, Si and Nb were observed at the oxide/ metal interface. Furthermore, Al and Ti were concentrated primarily in the metal surface close to the oxide/metal interface. Secondary ion mass spectrometry sputter depth profiles using different ion sources; Ga-69(+), Bi-3(+)/Cs+ and C-60(+)/C(60)(2+)were compared with TEM oxide scale cross-section and field emission gun-Auger electron spectroscopy depth profiling. Secondary ion mass spectrometry depth profiling with Ga-69(+), Bi(3)z/Cs+ showed decreased secondary ion yields in the metallic matrix. This decrease could be avoided using oxygen flooding. The C-60 cluster ion depth profiles were less sensitive to type of matrix and gave the best correspondence to the TEM cross-section. However, the impact energy has to be high enough to avoid carbon deposition.
Ämne (baseras på Högskoleverkets indelning av forskningsämnen):
TEKNIK OCH TEKNOLOGIER ->
Kemiteknik
TEKNIK OCH TEKNOLOGIER ->
Materialteknik
Nyckelord:
Secondary ion mass spectrometry, Oxide scale, Depth profiling, Solid oxide fuel cell
Postens nummer:
213580
Posten skapad:
2015-03-10 14:45
Posten ändrad:
2016-08-23 15:54

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