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Influence of background concentration induced field on the emission rate signatures of an electron trap in zinc oxide Schottky devices

Författare och institution:
Hadia Noor (-); Peter Klason (Institutionen för fysik (GU)); S. M. Faraz (-); O. Nur (-); Q. Wahab (-); M. Willander (-); M. Asghar (-)
Publicerad i:
JOURNAL OF APPLIED PHYSICS, 107 ( 10 ) s. 103717 (5 pages)
Artikel, refereegranskad vetenskaplig
Sammanfattning (abstract):
Various well-known research groups have reported points defects in bulk zinc oxide (ZnO) [ND (intrinsic): 1014–1017 cm−3] naming oxygen vacancy, zinc interstitial, and/or zinc antisite having activation energy in the range of 0.32–0.22 eV below conduction band. The attribution is probably based on activation energy of the level which seems not to be plausible in accordance with Vincent et al., [J. Appl. Phys. 50, 5484 (1979)] who suggested that it was necessary to become vigilant before interpreting the data attained for a carrier trap using capacitance transient measurement of diodes having ND greater than 1015 cm−3. Accordingly the influence of background free-carrier concentration, ND induced field on the emission rate signatures of an electron point defect in ZnO Schottky devices has been investigated by means of deep level transient spectroscopy. A number of theoretical models were tried to correlate with the experimental data to ascertain the mechanism. Consequently Poole–Frenkel model based on Coulomb potential was found consistent. Based on these investigations the electron trap was attributed to Zn-related charged impurity. Qualitative measurements like current-voltage and capacitance-voltage measurements were also performed to support the results.
Ämne (baseras på Högskoleverkets indelning av forskningsämnen):
deep levels, semiconductors, zno, ionization, defects, centers, level, donor
Postens nummer:
Posten skapad:
2011-04-20 16:32
Posten ändrad:
2012-01-03 09:52

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